The 2016 Image Contest Grand Prize Winner, Webcast: How Image Accuracy Impacts Your Research. Johann-Joachim-Becherweg 9-11 A state of the art remote control system allows these beams to be delivered form the Control Room located away from the instruments. Make/ Model: FEI Tecnai F20. AG Markl The Transmission Electron Microscopy TEM laboratory is a state-of-the-art facility equipped with a FEI Tecnai G2 F20 X-Twin transmission electron microscope and a FEI FIB200TEM Focused Ion Beam device for specimen preparation. Click here to sign up. Instrument Description: 200kV FEG-TEM.

Institut für Zoologie As the world's first fully integrated TEM, it provided new levels of productivity and ease-of-use. Loading/unloading of a grid from the single tilt holder3. Effect of numerical value of spot size on beam current/probe size This objective lens allows a 40 degree tilt with a standard low-background double tilt holder and, with the tomography holder, allows +/-70 degrees of tilt. The newest version of the Tecnai Microscope control software, version 4.0 is released January 2010. 23 keV He + 1.2 MeV Kr irradiation into pure Fe at 450°C The microscope is interfaced with a particle accelerator and a low energy ion source. Das FEI Tecnai G2 12 BioTwin ist ein leistungsfähiges, auf hohen Kontrast ausgelegtes Transmissionselektronenmikroskop (TEM).

With a single 30mm2 detector, the EDX acquisition solid angle for collection is ~0.4sr, rivaling more expensive systems. American Optical Heavy Duty Sliding Microtome ; Cressington 108 Sputter Coater ; Cressington 208HR Sputter Coater ; Cressington 308 Evaporative Coater ; Diener Zepto Plasma Cleaner ; FEI Vitrobot Mk.

AG Wolfrum Upgrades & Accessories available for Tecnai TEM Thermo Fisher Scientific instruments are designed for long term serviceability, growing with you as your research needs expand or change. With this new version, the Tecnai software has evolved into a mature product that offers the most complete functionality of any modern TEM/STEM system currently on the market, with further improved ease of use and reliability.

This microscope is optimized for materials applications that require either the high-resolution STEM performance (imaging and spectroscopy by Electron Energy Loss Energy and Dispersive XRAY) or correlated imaging and analytical methods for (TEM and STEM). Acquiring an image using the digital camera6. The objective lens design allows for efficient collection of X-rays for elemental analysis down to the sub-nanometer level. FEI Tecnai G2 F30 TEM.

55128 Mainz

Talos L120C TEM for Materials Science CompuStage High-Visibility, Low-Background, Double-Tilt Specimen Holder, Supports over 20 Digital Cameras and Energy Filters/Spectrometers, Integration with latest Gatan Gatan Digital Micrograph software (version 1.8.x), Guaranteeing true balance of your Tecnai hardware and software, Tecnai User Interface software version 4.x. Talos F200S TEM for Materials Science. The offer is depending on your current configuration, installed Software version and hardware. Es ist besonders geeignet für kontrastarme oder strahlempfindliche Proben und ausgerüstet für Cryo-TEM und Tomographie.

The Tecnai F20 is equipped with Lorentz Lens for magnetic imaging in Fresnel and Fouccault modes and NanoMegas Astar system for automated phase/orientation mapping of nanocrystals materials. All rights reserved. The Tecnai F20 microscope is a field emission 200kV S/TEM with an X-TWIN objective lens and high brightness field emission electron gun (FEG) optimized for analytical work. The Titan™ , released in 2006, demonstrates how FEI continuously raises the technology performance bar. Tel +49 6131 39-22878 Microsoft Windows XP based, FireWire adapters for Gatan Camera/Filter (Gatan DMA cards are not supported under Windows XP), PCI data acquisition card for STEM / SpotScan.

Two separate ion species can be mixed and delivered to the TEM stage for in-situ irradiation experiments.

Institut für Zoologie Microscope control upgrade contains hardware and software that enhances the ease of operation with embedded application software, ensures the full benefit of your systems' leading edge performance and also prepares your instrument for future developments. Die Untersuchungen können von eingewiesenen Nutzern selbst durchgeführt werden, da die Handhabung des Geräts gut zu … Loading/unloading of a holder from the column2.

Acceptable Use, Wolverine: 3 MV Tandem particle accelerator, Maize: 1.7 MV Tandem particle accelerator, The Regents of the University of Michigan, Diffraction: NBED and CBED – CCD camera works with diffraction recording. This microscope features a 1024x1024 CCD camera positioned after the Gatan Imaging Filter (GIF) that can be used for both dedicated spectroscopic analysis and energy-filtered imaging. The system has a Gatan Tridiem imaging filter for both energy-filtered imaging and EELS spectroscopy.

FEI Tecnai G2 F20 ST FE-TEM – Materials ; JEOL 1200 EX TEM ; JEOL JEM-2010 TEM ; Supporting Equipment. The Regents of the University of Michigan, Michigan Engineering | College Administration, 1221 Beal Avenue, Ann Arbor, MI 48109-2102, Safety Information | Privacy Policy | Specimen StagesFEI Single Tilt Holder +40° FEI Double Tilt Holder +30° Tomography holder + 80°, Gatan 636-DH low background Liquid nitrogen cooling holder -170°C/ 23°C Magnetizing Holder: In-plane magnetic field up to 900 Gauss Electron imaging from -300 Oe to +300 Oe Nanofactory Holder single tilt, for electron and force nanoprobing, Any published research using this MCF instrument should include the following acknowledgement statement: “The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785.”, Carnegie Mellon University5000 Forbes AvenueWean Hall 3325Pittsburgh, PA 15213412-268-2700 Fax 412-268-7596, Department of Materials Science and Engineering, Master of Science In Additive Manufacturing, Master of Science In Materials Science and Engineering, Objectives, Outcomes, Mission, Accreditations, Integrated Master and Bachelor (IMB) Degrees, Manufacturing and Materials Microstructure, Flexible high tension (20, 40, 80, 120, 160, 200 kV and values in between), Schottky field emitter with high maximum beam current (> 100 nA), High probe current (0.5 nA or more in 1 nm probe), Small energy spread (0.7 eV or less) • Spot drift < 1 nm/minute, Extended resolution (TrueImage) Minimum focus step (.16nm), Maximum diffraction angle STEM HAADF resolution (.19nm), STEM magnification range Maximum tilt angle with double-tilt holder + 40°, Maximum tilt angle with tomography holder + 80°.

The various techniques are integrated into the instrument software for ease of operation.

This is a single ended accelerator, that can provide ions through beamline 6 (BL6) in the 20 keV – 400 keV, single charge state, and .8, 1.2 and 1.6 MeV (2+, 3+ and 4+ respectively) for multiple ionized states of certain ions. Depending on your current configuration, installed software version and hardware options we customize the offer to what is required to bring your instrument to the latest standard supporting version 4.0.

© 2019 Thermo Fisher Scientific. The ion source installed on a separate beamline (BL8), is an Alphatross ion source also manufactured by NEC and capable of delivering H and He ions in the energy range of 5-30 keV. Talos Arctica TEM for Life Sciences. Gatan US4000 4k x 4k CCD, bottom-mount. TEM, electron tomography, cryoTEM.

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